Concerning the Effects of Noise on the Measurement of (Spectral) Line Strengths.


The effects of shot and detector noise on well-resolved measurements of line strength are investigated. Simple analysis, computer simulation and numerical analysis are applied to determine the optimum absorber quantities for both conventional and Fourier-transform spectrometers.  The sensitivity of these optimum absorber quantities to line shape, noise level and spectral resolution are investigated and shown to be small.  Inherent bias in the line strength measurements is explained and shown to be resolution-sensitive.  Consequences for experimental strategy are discussed.


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