Concerning the Effects of Noise on the Measurement of (Spectral)
Line Strengths.
Abstract
The effects of shot and detector noise on well-resolved measurements of
line strength are investigated. Simple analysis, computer simulation
and numerical analysis are applied to determine the optimum absorber
quantities for both conventional and Fourier-transform
spectrometers. The sensitivity of these optimum absorber
quantities to line shape, noise level and spectral resolution are
investigated and shown to be small. Inherent bias in the line
strength measurements is explained and shown to be
resolution-sensitive. Consequences for experimental strategy are
discussed.
Paper
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